Facilities#

Time-resolved cathodoluminescence spectroscopy#

UV-optimized cathodoluminescence (CL) spectroscopy system with time-integrated and time-resolved detection based on a scanning electron microscope (SEM) with pulsed electron beam and helium-cooled sample stage for measuring hyperspectral maps, as well as the lifetime of charge carriers in semiconductor materials, hetero- and nanostructures in the spectral range of 180-1050 nm.

Main specifications#

Thermo Fisher Verios 5 UC field emission scanning electron microscope

Excitation

  • Acceleration voltage: 350 V to 30 kV

  • Beam current (continuous): 0.8 pA to 100 nA

  • Beam diameter <1 nm

  • Ultrafast beam blanking: <50 ps

  • Laser-pulsed cathode (2 ps) planned

Other characteristics

  • He cold stage (10–300 K)

  • Electron beam-induced current (EBIC) measurements with triax-cabeling

  • Electron detectors: Everhart-Thornley, Through-lens, In-Column and Transmission

  • In-Situ plasma-cleaner

Delmic Sparc Spectral CL system extended by second spectrometer and time-resolved detection

UV/vis-spectrometer 180–850 nm

  • CCD with quantum efficiency > 40% from 200–800 nm (Andor Newton 940 BU2)

  • Hamamatsu streak camera with MgF₂ photocathode 180–830 nm, 800 fs time resolution

UV/vis/NIR-spectrometer 250–1050 nm

  • CCD with quantum efficiency > 80% from 400–900 nm (Andor Newton 920 BEX2-DD)

  • Linear low-noise, counting-Photomultiplier 185–850 nm

  • Time-correlated single photon counting and Hanbury-Brown-Twiss photon-correlation 220–800 nm

Analytical scanning electron microscope#

Zeiss Ultra55 field emission scanning electron microscope

cathodoluminescence-spectroscopy

Gatan MonoCL4 with He cold stage

  • Gratings for UV/vis/NIR

  • CCD 300–1050 nm

  • PMT 220–850 nm

  • PMT 800–1700 nm

Electron backscatter diffraction

EDAX Hikari Super

  • 640 x 480 pixel camera

  • Speed up to 1400 fps

  • Cross-Court4 Software for high-resolution EBSD-Analysis

Energy-dispersive X-ray spectroscopy

EDAX Octane Elect Super

  • 70 mm² Si-drift-detector

  • Energy resolution: 127 eV

  • Si₃N₄ window

Labeled photograph of the analytical SEM

Sample preparation#

Gatan Ilion cross-section polishing for scanning electron microscopy

Gatan Ilion Micrographs of three polished sample cross sections

Software#

Mapping material properties in analytical electron microscopy produces large amounts of data, as a spectrum or image is recorded at each pixel. In our case, these are cathodoluminescence spectra and transients (1-2 spatial + 1 signal dimension), but also combined spectral and time-resolved data sets (1-2 spatial + 2 signal dimensions). The efficient handling, targeted evaluation and appropriate visualization of these multidimensional (hyperspectral) data sets requires suitable tools.

The PDI is involved in the development of the open-source Python package HyperSpy and some of its extensions. In particular, we initiated the extension package LumiSpy together with the CL group at the University of Cambridge in 2020, which we continue to develop further - focusing on time-resolved luminescence spectroscopy within the framework of ZALKAL. These Python packages are jointly programmed by an international team of scientists and used by many colleagues worldwide. On this basis, even complex analysis routines can be programmed and reliably reproduced with little effort.

HyperSpy banner

Based on established Python packages, HyperSpy provides easy access to analysis tools that exploit the multidimensionality of data sets, including spectral modeling and machine learning algorithms. This is complemented by options for interactive visualization of the data.

LumiSpy banner

The LumiSpy extension supplements HyperSpy with specific functions for cathodoluminescence and photoluminescence data, but is also useful for data from other methods, e.g. Raman spectroscopy, electroluminescence and Fourier transform infrared spectroscopy. This includes e.g. the conversion of the data axes units.

RosettaSciIO banner

RosettaSciIO enables the reading and saving of scientific data formats from electron microscopy and beyond. Both overarching formats and many manufacturer-specific file types are supported. Important metadata is also read in and made available in a standardized tree structure.